Agilent-HP 4155B

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Semiconductor Parameter Analyzer

The 4155B Semiconductor Parameter Analyzer is a stand-alone instrument capable of complete dc characterization of semiconductor devices and materials. It stimulates voltage and current sensitive devices measures the resulting current and voltage response and displays the results in a user-selectable format (graph list matrix or schmoo) on a built-in CRT display.

Features:
High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy) V: 1V to 200 V
Fully-automated I-V sweep measurements with dc or pulse mode expandable up to 6 SMUs
Synchronized stress/measure function two high-voltage pulse generator units (40 V)
Time-domain measurement: 60s variable intervals up to 10 001 points
Easy to use: knob-sweep similar to curve tracer automatic analysis functions
Automation: built-in HP Instrument BASIC trigger I/O capability

Options:

050 = 50Hz line frequency 50Hz line frequency For 50Hz line frequency.
060 = 60Hz line frequency 60Hz line frequency For 60Hz line frequency.

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For more information on the Agilent-HP 4155B please visit Test Equipment Connection